6 citations · 6 across the 1 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2026
Orientation refinement for nanobeam precession electron diffraction patterns using spot intensity profiles
Arthur Després, Muriel Vérion, Edgar F. Rauch
We develop a method to measure crystallographic orientations with high angular resolution for nano-beam precession electron diffraction patterns, and applicable to 4D scanning prec…
cond-mat.mtrl-sci2023★ 6 cited
Improved ACOM pattern matching in 4D STEM through adaptive sub pixel peak detection and image reconstruction
Nicolas Folastre, Junhao Cao, Gozde Oney +7
The technique known as 4D-STEM has recently emerged as a powerful tool for the local characterization of crystalline structures in materials, such as cathode materials for Li-ion b…