450 citations · 524 across the 7 of their papers we have counts for
7 papers
Learning Test-Mutant Relationship for Accurate Fault Localisation
Jinhan Kim, Gabin An, Robert Feldt +1
Context: Automated fault localisation aims to assist developers in the task of identifying the root cause of the fault by narrowing down the space of likely fault locations. Simula…
The Inversive Relationship Between Bugs and Patches: An Empirical Study
Jinhan Kim, Jongchan Park, Shin Yoo
Software bugs pose an ever-present concern for developers, and patching such bugs requires a considerable amount of costs through complex operations. In contrast, introducing bugs…
Repairing DNN Architecture: Are We There Yet?
Jinhan Kim, Nargiz Humbatova, Gunel Jahangirova +2
As Deep Neural Networks (DNNs) are rapidly being adopted within large software systems, software developers are increasingly required to design, train, and deploy such models into…
Predictive Mutation Analysis via Natural Language Channel in Source Code
Jinhan Kim, Juyoung Jeon, Shin Hong +1
Mutation analysis can provide valuable insights into both System Under Test (SUT) and its test suite. However, it is not scalable due to the cost of building and testing a large nu…
Reducing DNN Labelling Cost using Surprise Adequacy: An Industrial Case Study for Autonomous Driving
Jinhan Kim, Jeongil Ju, Robert Feldt +1
Deep Neural Networks (DNNs) are rapidly being adopted by the automotive industry, due to their impressive performance in tasks that are essential for autonomous driving. Object seg…
Ahead of Time Mutation Based Fault Localisation using Statistical Inference
Jinhan Kim, Gabin An, Robert Feldt +1
Mutation analysis can effectively capture the dependency between source code and test results. This has been exploited by Mutation Based Fault Localisation (MBFL) techniques. Howev…
Guiding Deep Learning System Testing using Surprise Adequacy
Jinhan Kim, Robert Feldt, Shin Yoo
Deep Learning (DL) systems are rapidly being adopted in safety and security critical domains, urgently calling for ways to test their correctness and robustness. Testing of DL syst…