most citedDetermination of the thickness and orientation of few-layer tungsten ditelluride using polarized Raman spectroscopy

42 citations · 42 across the 1 of their papers we have counts for

collaborators

1 paper

cond-mat.mes-hall2016★ 42 cited

Determination of the thickness and orientation of few-layer tungsten ditelluride using polarized Raman spectroscopy

Minjung Kim, Songhee Han, Jung Hwa Kim +3

Orthorhombic tungsten ditelluride (WTe2), with a distorted 1T structure, exhibits a large magnetoresistance that depends on the orientation, and its electrical characteristics chan…