Physics-aware global Rietveld refinement for high-energy X-ray diffraction microscopy with application to reconstructing intragranular orientation and strain fields

Carter K. Cocke, Eitan Camacho, Sara F. Gorske +2

High-energy X-ray diffraction microscopy (HEDM) has emerged as a critical technique for studying the microstructure and, increasingly, strain fields in solids. However, current alg…