most citedElastic Mid-Infrared Light Scattering: a Basis for Microscopy of Large-Scale Electrically Active Defects in Semiconducting Materials

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cond-mat.mtrl-sci2010★ 6 cited

Elastic Mid-Infrared Light Scattering: a Basis for Microscopy of Large-Scale Electrically Active Defects in Semiconducting Materials

V. P. Kalinushkin, V. A. Yuryev, O. V. Astafiev

A method of the mid-IR-laser microscopy has been proposed for the investigation of the large-scale electrically and recombination active defects in semiconductors and non-destructi…

cond-mat.mtrl-sci2010

Terahertz conductivity of Si and of Ge/Si(001) heterostructures with quantum dots

E. S. Zhukova, B. P. Gorshunov, A. S. Prokhorov +7

With an MBE technique, a Si/Ge heterostructures are prepared containing layers of nanostructured Ge with quantum dots of size of several nanometers. The effective conductivity of t…