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eess.SY2026
Precision Specimen Positioning in Electron Microscopy through Hysteresis Compensation, Iterative Learning, and Vision-Based Sensing
J. S. van Hulst, A. M. C. de Peffer, D. Herceg +4
Electron microscopy requires nanometer-scale specimen positioning over a long stroke. Piezo-stepper actuators are well suited for this task, but their accuracy is limited by hyster…
eess.SY2026
Estimating Evolving Functions with Dynamic Gaussian Processes
J. S. van Hulst, W. P. M. H. Heemels, D. J. Antunes
This paper develops the Dynamic Gaussian Process (DGP), a framework for estimating functions governed by integro-difference equations (IDEs). IDEs model continuous functions that e…
eess.SY2026
Tilt-based Aberration Estimation in Transmission Electron Microscopy
Jilles S. van Hulst, Erik M. Franken, Bart J. Janssen +2
Transmission electron microscopes (TEMs) enable atomic-scale imaging but suffer from aberrations caused by lens imperfections and environmental conditions, reducing image quality.…