most citedMicroscopic Origin of Charged Impurity Scattering and Flicker Noise in MoS2 field-effect Transistors

2 citations · 2 across the 1 of their papers we have counts for

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1 paper

cond-mat.mes-hall2014★ 2 cited

Microscopic Origin of Charged Impurity Scattering and Flicker Noise in MoS2 field-effect Transistors

Subhamoy Ghatak, Sumanta Mukherjee, Manish Jain +2

Scattering of charge carriers and flicker noise in electrical transport are the central performance limiting factors in electronic devices, but their microscopic origin in molybden…