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cs.CV2023
Wafer Map Defect Patterns Semi-Supervised Classification Using Latent Vector Representation
Qiyu Wei, Wei Zhao, Xiaoyan Zheng +1
As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increas…
cs.CV2023
A Deeply Supervised Semantic Segmentation Method Based on GAN
Wei Zhao, Qiyu Wei, Zeng Zeng
In recent years, the field of intelligent transportation has witnessed rapid advancements, driven by the increasing demand for automation and efficiency in transportation systems.…