most citedDynamic evolution of internal stress, grain growth, and crystallographic texture in arc-evaporated AlTiN thin films using in-situ synchrotron x-ray diffraction

1 citations · 1 across the 1 of their papers we have counts for

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1 paper

cond-mat.mtrl-sci2023★ 1 cited

Dynamic evolution of internal stress, grain growth, and crystallographic texture in arc-evaporated AlTiN thin films using in-situ synchrotron x-ray diffraction

Sanjay Nayak, Tun-Wei Hsu, Robert Boyd +5

Understanding the nucleation and growth of polycrystalline thin films is a long-standing goal. Polycrystalline films have many grains with different orientations that affect thin-f…