collaborators

1 paper

cond-mat.mes-hall2002

Measuring Lateral Magnetic Structure in Thin Films Using Polarized Neutron Reflectometry

W. -T. Lee, S. G. E. te Velthuis, G. P. Felcher +4

Polarized neutron reflectometry (PNR) has long been applied to measure the magnetic depth profile of thin films. In recent years, interest has increased in observing lateral magnet…