Probing the magnetic moment of FePt micromagnets prepared by Focused Ion Beam milling

H. C. Overweg, A. M. J. den Haan, H. J. Eerkens +5

We investigate the degradation of the magnetic moment of a 300 nm thick FePt film induced by Focused Ion Beam (FIB) milling. A $1\mu \mathrm{m}\times 8\mu \mathrm{m}$ rod is milled ou…