115 citations · 215 across the 16 of their papers we have counts for
7 papers · 1 filter
Three-Dimensional Freeform Reflector Design with a Microfacet Surface Roughness Model
Vì Kronberg, Martijn Anthonissen, Jan ten Thije Boonkkamp +1
This manuscript will unify inverse freeform reflector design and surface light scattering to design freeform reflectors with a scattering surface. We use microfacets, which are sma…
Concatenated Backward Ray Mapping on the Compound Parabolic Concentrator
Willem Jansen, Martijn Anthonissen, Jan ten Thije Boonkkamp +1
Concatenated backward ray mapping is an alternative for ray tracing in 2D. It is based on the phase-space description of an optical system. Phase space is the set of position and d…
Design of two-dimensional reflective imaging systems: An approach based on inverse methods
Sanjana Verma, Martijn J. H. Anthonissen, Jan H. M. ten Thije Boonkkamp +1
Imaging systems are inherently prone to aberrations. We present an optimization method to design two-dimensional freeform reflectors that minimize aberrations for various parallel…
Three-Dimensional Freeform Reflector Design with a Scattering Surface
Vì Kronberg, Martijn Anthonissen, Jan ten Thije Boonkkamp +1
We introduce a novel approach to calculating three-dimensional freeform reflectors with a scattering surface. Our method is based on optimal transport and utilizes a Fredholm integ…
Computing aberration coefficients for plane-symmetric reflective systems: A Lie algebraic approach
A. Barion, M. J. H. Anthonissen, J. H. M. ten Thije Boonkkamp +1
We apply the Lie algebraic method to reflecting optical systems with plane-symmetric freeform mirrors. Using analytical ray-tracing equations we construct an optical map. The expan…
Two-Dimensional Freeform Reflector Design with a Scattering Surface
Vì Kronberg, Martijn Anthonissen, Jan ten Thije Boonkkamp +1
We combine two-dimensional freeform reflector design with a scattering surface modelled using microfacets, i.e., small specular surfaces representing surface roughness. The model r…
Alternative computation of the Seidel aberration coefficients using the Lie algebraic method
A. Barion, M. J. H. Anthonissen, J. H. M. ten Thije Boonkkamp +1
We give a brief introduction to Hamiltonian optics and Lie algebraic methods. We use these methods to describe the operators governing light propagation, refraction and reflection…