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19962024
most citedUniversal fluctuations in the growth of semiconductor thin films

83 citations · 447 across the 25 of their papers we have counts for

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Showing 2015 · cond-mat.mtrl-sciShow all

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cond-mat.mtrl-sci2015★ 21 cited

Substrate effects and diffusion dominated roughening in Cu2O electrodeposition

I. S. Brandt, V. C. Zoldan, V. Stenger +4

Cuprous oxide (Cu2O) films from 25 nm to 1500 nm were electrodeposited on n-Si(100) and Ni/n-Si(100) substrates from aqueous solution at room temperature. X-ray diffraction and tra…