2 papers
cond-mat.mes-hall2024
Needle in a haystack: efficiently finding atomically defined quantum dots for electrostatic force microscopy
José Bustamante, Yoichi Miyahara, Logan Fairgrieve-Park +5
The ongoing development of single electron, nano and atomic scale semiconductor devices would benefit greatly from a characterization tool capable of detecting single electron char…
cond-mat.mtrl-sci2023
Detection Sensitivity Limit of Hundreds of Atoms with X-Ray Fluorescence Microscopy
Mateus G. Masteghin, Toussaint Gervais, Steven K. Clowes +10
We report X-ray fluorescence (XRF) imaging of nanoscale inclusions of impurities for quantum technology. A very bright diffraction-limited focus of the X-ray beam produces very hig…