2 papers
cond-mat.mes-hall2024
Needle in a haystack: efficiently finding atomically defined quantum dots for electrostatic force microscopy
José Bustamante, Yoichi Miyahara, Logan Fairgrieve-Park +5
The ongoing development of single electron, nano and atomic scale semiconductor devices would benefit greatly from a characterization tool capable of detecting single electron char…
cond-mat.mes-hall2019
Optical excitation of atomic force microscopy cantilever for accurate spectroscopic measurements
Yoichi Miyahara, Harrisonn Griffin, Antoine Roy-Gobeil +4
Reliable operation of frequency modulation mode atomic force microscopy (FM-AFM) depends on a clean resonance of an AFM cantilever. It is recognized that the spurious mechanical re…