2 papers
cs.CV2024
Progressive Alignment with VLM-LLM Feature to Augment Defect Classification for the ASE Dataset
Chih-Chung Hsu, Chia-Ming Lee, Chun-Hung Sun +1
Traditional defect classification approaches are facing with two barriers. (1) Insufficient training data and unstable data quality. Collecting sufficient defective sample is expen…
cs.CV2024
OCR is All you need: Importing Multi-Modality into Image-based Defect Detection System
Chih-Chung Hsu, Chia-Ming Lee, Chun-Hung Sun +1
Automatic optical inspection (AOI) plays a pivotal role in the manufacturing process, predominantly leveraging high-resolution imaging instruments for scanning purposes. It detects…