Observation of fluctuation-induced tunneling conduction in micrometer-sized tunnel junctions

Yu-Ren Lai, Kai-Fu Yu, Yong-Han Lin +2

Micrometer-sized Al/AlO${}_x$/Y tunnel junctions were fabricated by the electron-beam lithography technique. The thin ($\approx$ 1.5--2 nm thickness) insulating AlO${}_x$ layer was…