activity
20042022
most citedSpectroscopic imaging of single atoms within a bulk solid

326 citations · 371 across the 7 of their papers we have counts for

collaborators

7 papers

physics.ins-det2022★ 9 cited

How Fast is Your Detector? The Effect of Temporal Response on Image Quality

Tiarnan Mullarkey, Matthew Geever, Jonathan J. P. Peters +3

With increasing interest in high-speed imaging should come an increased interest in the response times of our scanning transmission electron microscope (STEM) detectors. Previous w…

physics.app-ph2022★ 5 cited

Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions

Zezhong Zhang, Ivan Lobato, Annick De Backer +2

Advanced materials often consist of multiple elements which are arranged in a complicated structure. Quantitative scanning transmission electron microscopy is useful to determine t…

cond-mat.mtrl-sci2021

Procedure for 3D atomic resolution reconstructions using atom-counting and a Bayesian genetic algorithm

Annick De Backer, Sandra Van Aert, Peter D. Nellist +1

We introduce a Bayesian genetic algorithm for reconstructing atomic models of nanoparticles from a single projection using Z-contrast imaging. The number of atoms in a projected at…

physics.ins-det2021★ 2 cited

Increasing Spatial Fidelity and SNR of 4D-STEM using Multi-frame Data Fusion

Colum M. O'Leary, Benedikt Haas, Christoph T. Koch +2

4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementin…

cond-mat.mtrl-sci2019★ 10 cited

Direct Imaging of Charge Redistribution due to Bonding at Atomic Resolution via Electron Ptychography

Gerardo T. Martinez, Benjamin X. Shi, Timothy C. Naginey +6

Phase imaging in electron microscopy is sensitive to the local potential, including charge redistribution from bonding. We demonstrate that electron ptychography provides the neces…

cond-mat.mtrl-sci2019★ 19 cited

The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials

K. H. W. van den Bos, L. Janssens, A. De Backer +2

The atomic lensing model has been proposed as a promising method facilitating atom-counting in heterogeneous nanocrystals [KHW van den Bos et. al, Phys. Rev. Lett. 116 (2016) 24610…