activity
20242026
collaborators

8 papers

physics.optics2026

Lateral shearing optical diffraction tomography of brain organoid with reduced spatial coherence

Pawel Goclowski, Julianna Winnik, Vishesh Dubey +6

Optical diffraction tomography (ODT) is a powerful technique for quantitative, label-free reconstruction of the three-dimensional refractive index (RI) distribution of biological s…

physics.optics2026

Near-infrared lensless holographic microscopy on a visible sensor enables label-free high-throughput imaging in strong scattering

Emilia Wdowiak, Piotr Arcab, Mikolaj Rogalski +6

Lensless digital holographic microscopy (LDHM) relies on interference between an unscattered reference wave and a weakly scattered object wave - an assumption that rapidly fails in…

physics.optics2026

The mixture of glycerin with tartrazine: a solution to reversibly increase tissue transparency for in vitro quantitative phase imaging

Mikolaj Krysa, Anna Chwastowicz, Malgorzata Lenarcik +3

Thick tissue sections strongly scatter and absorb light, which limits transmission-based label-free examination via quantitative phase imaging (QPI) modalities. Here we introduce a…

physics.med-ph2025

High Space-bandwidth Product Label-free Examination of iPSC-derived Brain Organoids via Fourier Ptychographic Microscopy

Mikolaj Krysa, Mikolaj Rogalski, Piotr Arcab +7

Fourier ptychographic microscopy (FPM) is a promising quantitative phase imaging technique that enables high-resolution, label-free imaging over a large field-of-view. Here, we pre…

physics.optics2025

Low-dose Chemically Specific Bioimaging via Deep-UV Lensless Holographic Microscopy on a Standard Camera

Piotr Arcab, Mikolaj Rogalski, Karolina Niedziela +11

Deep-ultraviolet (DUV) microscopy can provide label-free biochemical contrast by exploiting the intrinsic absorption of nucleic acids, proteins and lipids, offering chemically spec…

physics.optics2025

Bayesian inference for precise and uncertainty-quantified single-shot widefield interferometric geometrical nanometrology

Damian Suski, Maria Cywinska, Julianna Winnik +5

Advanced geometrical nanometrology is critical for process control in semiconductor manufacturing, supporting applications in, e.g., photonic integrated circuits, nanoelectronics,…