Hole Doping Dependence of the Coherence Length in $L{a}_{2-x}S{r}_{x}Cu{O}_4$ Thin Films

H. H. Wen, H. P. Yang, S. L. Li +4

By measuring the field and temperature dependence of magnetization on systematically doped $L{a}_{2-x}S{r}_{x}Cu{O}_4$ thin films, the critical current density $j_c(0)$ and the collective…