collaborators

1 paper

cond-mat.mtrl-sci2004

Real Space Imaging of the Microscopic Origins of the Ultrahigh Dielectric Constant in Polycrystalline CaCu3Ti4O12

S. V. Kalinin, J. Shin, G. M. Veith +4

The origins of an ultrahigh dielectric constant in polycrystalline CaCu3Ti4O12 (CCTO) was studied using the combination of impedance spectroscopy, electron microscopy, and scanning…