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stat.ML2025
Deep Subspace Learning for Surface Anomaly Classification Based on 3D Point Cloud Data
Xuanming Cao, Chengyu Tao, Juan Du
Surface anomaly classification is critical for manufacturing system fault diagnosis and quality control. However, the following challenges always hinder accurate anomaly classifica…
stat.ML2025
Ano-SuPs: Multi-size anomaly detection for manufactured products by identifying suspected patches
Hao Xu, Juan Du, Andi Wang +1
Image-based systems have gained popularity owing to their capacity to provide rich manufacturing status information, low implementation costs and high acquisition rates. However, t…