activity
20032022
most citedOrientation Dependence of Step Stiffness: Failure of SOS and Ising Models to Describe Experimental Data

43 citations · 133 across the 5 of their papers we have counts for

collaborators

5 papers

cond-mat.mtrl-sci2022★ 3 cited

A novel high-current, high-resolution, low-kinetic-energy electron source for inverse photoemission spectroscopy

H. Ibach, H. Sato, M. Kubo +3

A high-current electron source for inverse photoemission spectroscopy (IPES) is described. The source comprises a thermal cathode electron emission system, an electrostatic deflect…

physics.ins-det2016★ 26 cited

Electron energy loss spectroscopy with parallel readout of energy and momentum

Harald Ibach, François C. Bocquet, Jessica Sforzini +2

We introduce a high energy resolution electron source that matches the requirements for parallel readout of energy and momentum of modern hemispherical electron energy analyzers. T…

cond-mat.mtrl-sci2004★ 32 cited

Low-Temperature Orientation Dependence of Step Stiffness on {111} Surfaces

T. J. Stasevich, Hailu Gebremariam, T. L. Einstein +3

For hexagonal nets, descriptive of {111} fcc surfaces, we derive from combinatoric arguments a simple, low-temperature formula for the orientation dependence of the surface step li…

cond-mat.mtrl-sci2004★ 29 cited

The Effects of Next-Nearest-Neighbor Interactions on the Orientation Dependence of Step Stiffness: Reconciling Theory with Experiment for Cu(001)

T. J. Stasevich, T. L. Einstein, R. K. P. Zia +3

Within the solid-on-solid (SOS) approximation, we carry out a calculation of the orientational dependence of the step stiffness on a square lattice with nearest and next-nearest ne…

cond-mat.mtrl-sci2003★ 43 cited

Orientation Dependence of Step Stiffness: Failure of SOS and Ising Models to Describe Experimental Data

Sabine Dieluweit, Harald Ibach, Margret Giesen +1

We have investigated the step stiffness on Cu(001) surfaces as a function of step orientation by two independent methods at several temperatures near 300 K. Both sets of data agree…