collaborators

1 paper

cond-mat.str-el2026

Dominant Role of Sulphur divacancy in Charge Trapping Dynamics in MoS

Srest Somay, Sitangshu Bhattacharya, Krishna Balasubramanian

Intrinsic defects govern carrier trapping and recombination in two-dimensional semiconductors, yet the microscopic origin of defect-dependent capture dynamics remains unclear. Here…