38 citations · 104 across the 10 of their papers we have counts for
4 papers · 1 filter
Beam damage of single semiconductor nanowires during X-ray nano beam diffraction experiments
Ali AlHassan, Jonas Lähnemann, Arman Davtyan +8
Nanoprobe X-ray diffraction (nXRD) using focused synchrotron radiation is a powerful technique to study the structural properties of individual semiconductor nanowires. However, wh…
Artificial piezoelectricity in centrosymmetric SrTiO3
B. Khanbabaee, E. Mehner, C. Richter +7
Defect engineering is an effective and powerful tool to control existing material properties and create completely new ones, which are symmetry-forbidden in a defect-free crystal.…
Structural information extracted from the diffraction of XFEL fs-pulses in a crystal
A. Leonov, D. Ksenzov, A. Benediktovitch +2
We present a theoretical justification for a method of extracting of supplementary information for the phase retrieval procedure taken from diffraction of fs-pulses from X-ray Free…
Crystallography under external electric field
Semen Gorfman, Oleg Schmidt, Vladimir Tsirelson +2
Structural response of crystals to an applied external perturbation is important as a key for understanding microscopic origin of physical properties. Experimental investigation of…