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20002026
most citedCoherence Properties of Individual Femtosecond Pulses of an X-ray Free-Electron Laser

170 citations · 1.8k across the 79 of their papers we have counts for

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Showing 2013Show all

8 papers · 1 filter

cond-mat.soft2013★ 5 cited

Spatial properties of conjugated network in semicrystalline polymer thin films studied by intensity x-ray cross-correlation functions

R. P. Kurta, L. Grodd, E. Mikayelyan +6

We present results of x-ray study of spatial properties of conjugated networks in polymer thin films. We applied the x-ray cross-correlation analysis to x-ray scattering data…

physics.optics2013★ 4 cited

Ptychography imaging of the phase vortices in the x-ray beam formed by nanofocusing lenses

D. Dzhigaev, U. Lorenz, R. Kurta +11

We present the ptychography reconstruction of the x-ray beam formed by nanofocusing lenses (NFLs) containing a number of phase singularities (vortices) in the vicinity of the focal…

cond-mat.soft2013★ 29 cited

X-ray cross-correlation analysis of liquid crystal membranes in the vicinity of hexatic-smectic phase transition

R. P. Kurta, B. I. Ostrovskii, A. Singer +7

We present an x-ray study of liquid crystal membranes in the vicinity of hexatic-smectic phase transition by means of angular x-ray cross-correlation analysis (XCCA). By applying t…

physics.optics2013★ 35 cited

Coherence properties of focused X-ray beams at high brilliance synchrotron sources

A. Singer, I. A. Vartanyants

An analytical approach describing properties of focused partially coherent X-ray beams is presented. The method is based on the results of statistical optics and gives both the bea…

cond-mat.mes-hall2013★ 2 cited

Coherent X-ray Diffraction Imaging of Nanostructures

Ivan A. Vartanyants, Oleksandr M. Yefanov

We present here an overview of Coherent X-ray Diffraction Imaging (CXDI) with its application to nanostructures. This imaging approach has become especially important recently due…

cond-mat.dis-nn2013★ 17 cited

X-ray cross-correlation analysis of disordered systems: potentials and limitations

R. P. Kurta, M. Altarelli, I. A. Vartanyants

Angular x-ray cross-correlation analysis (XCCA) is an approach to study the structure of disordered systems using the results of x-ray scattering experiments. In this paper we summ…