44 citations · 72 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2003★ 44 cited
STM characterization of the Si-P heterodimer
N. J. Curson, S. R. Schofield, M. Y. Simmons +3
We use scanning tunneling microscopy (STM) and Auger electron spectroscopy to study the behavior of adsorbed phosphine (PH) on Si(001), as a function of annealing temperature…
cond-mat.mtrl-sci2003★ 28 cited
Split-off dimer defects on the Si(001)2x1 surface
S. R. Schofield, N. A. Marks, N. J. Curson +6
Dimer vacancy (DV) defect complexes in the Si(001)2x1 surface were investigated using high-resolution scanning tunneling microscopy and first principles calculations. We find that…