2 papers
cond-mat.mtrl-sci2005
Direct Observation of Site-specific Valence Electronic Structure at Interface: SiO2/Si Interface
Y. Yamashita, S. Yamamoto, K. Mukai +8
Atom specific valence electronic structures at interface are elucidated successfully using soft x-ray absorption and emission spectroscopy. In order to demonstrate the versatility…
cond-mat.str-el2003
Layer dependent band dispersion and correlations using tunable Soft X-ray ARPES
N. Kamakura, Y. Takata, T. Tokushima +4
Soft X-ray Angle-Resolved Photoemission Spectroscopy is applied to study in-plane band dispersions of Nickel as a function of probing depth. Photon energies between 190 and 780 eV…