2 papers
eess.SP2024
A Near-Field Super-Resolution Network for Accelerating Antenna Characterization
Yuchen Gu, Hai-Han Sun, Daniel W. van der Weide
We present a deep neural network-enabled method to accelerate near-field (NF) antenna measurement. We develop a Near-field Super-resolution Network (NFS-Net) to reconstruct signifi…
cond-mat.mes-hall2005
Quantum Dots and Etch-Induced Depletion of a Silicon 2DEG
L. J. Klein, K. L. M. Lewis, K. A. Slinker +8
The controlled depletion of electrons in semiconductors is the basis for numerous devices. Reactive-ion etching provides an effective technique for fabricating both classical and q…