14 citations · 28 across the 5 of their papers we have counts for
4 papers · 1 filter
Quantitative determination of twist angle and strain in Van der Waals moiré superlattices
Steven J. Tran, Jan-Lucas Uslu, Mihir Pendharkar +9
Scanning probe techniques are popular, non-destructive ways to visualize the real space structure of Van der Waals moirés. The high lateral spatial resolution provided by these tec…
Thermal relaxation of strain and twist in ferroelectric hexagonal boron nitride moiré interfaces
Marisa Hocking, Christina E. Henzinger, Steven Tran +6
New properties can arise at van der Waals (vdW) interfaces hosting a moiré pattern generated by interlayer twist and strain. However, achieving precise control of interlayer twist/…
Torsional Force Microscopy of Van der Waals Moirés and Atomic Lattices
Mihir Pendharkar, Steven J. Tran, Gregory Zaborski +13
In a stack of atomically-thin Van der Waals layers, introducing interlayer twist creates a moiré superlattice whose period is a function of twist angle. Changes in that twist angle…
Nanoscale electronic transparency of wafer-scale hexagonal boron nitride
Caleb Z. Zerger, Linsey K. Rodenbach, Yi-Ting Chen +8
Monolayer hBN has attracted interest as a potentially weakly interacting 2D insulating layer in heterostructures. Recently, wafer-scale hBN growth on Cu(111) has been demonstrated…