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cond-mat.soft2005
Conformational rearrangements in thin films of polydimethylsiloxane melt
Guennadi Evmenenko, Haiding Mo, Sumit Kewalramani +1
Synchrotron X-ray reflectivity (XRR) confirms the formation of a quasi-immobilized layer in thin films of polydimethylsiloxane (PDMS) melts near silica surfaces. This layer (40-60A…
cond-mat.soft2005
Observation of surface layering in a nonmetallic liquid
Haiding Mo, Guennadi Evmenenko, Sumit Kewalramani +3
Oscillatory density profiles (layers) have previously been observed at the free surfaces of liquid metals, but not in other isotropic liquids. We have used x-ray reflectivity to st…