most citedSubsampling Methods for Fast Electron Backscattered Diffraction Analysis

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cond-mat.mtrl-sci2023

In silico Ptychography of Lithium-ion Cathode Materials from Subsampled 4-D STEM Data

Alex W. Robinson, Amirafshar Moshtaghpour, Jack Wells +5

High quality scanning transmission electron microscopy (STEM) data acquisition and analysis has become increasingly important due to the commercial demand for investigating the pro…