most citedAccelerating Domain-Aware Electron Microscopy Analysis Using Deep Learning Models with Synthetic Data and Image-Wide Confidence Scoring

4 citations · 4 across the 1 of their papers we have counts for

collaborators

1 paper

cs.CV2024★ 4 cited

Accelerating Domain-Aware Electron Microscopy Analysis Using Deep Learning Models with Synthetic Data and Image-Wide Confidence Scoring

Matthew J. Lynch, Ryan Jacobs, Gabriella Bruno +3

The integration of machine learning (ML) models enhances the efficiency, affordability, and reliability of feature detection in microscopy, yet their development and applicability…