2 papers
cond-mat.mtrl-sci2006
Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary
F. Pérez-Willard, D. Wolde-Giorgis, T. Al-Kassab +4
Needle-shaped atom probe specimens containing a single grain boundary were produced using the focused ion beam (FIB) of a dual-beam FIB/SEM (scanning electron microscope) system. T…
cond-mat.supr-con2003
Determining the current polarization in Al/Co nanostructured point contacts
F. Perez-Willard, J. C. Cuevas, C. Suergers +4
We present a study of the Andreev reflections in superconductor/ferromagnet nanostructured point contacts. The experimental data are analyzed in the frame of a model with two spin-…