most citedShallow Trap States Control Electrical Performance of Amorphous Oxide Semiconductor Thin-Film Transistors

1 citations · 2 across the 2 of their papers we have counts for

collaborators

2 papers

cond-mat.mtrl-sci2026★ 1 cited

Experiments and Modeling of Defect Dynamics and BTI Behavior in Doped InO TFTs during C Post-Processing Forming Gas Annealing

Yu-Hsin Kuo, Chengyang Zhang, Priyankka Ravikumar +13

We investigate the impact of a monolithic three-dimensional (M3D) integration process-critical C post-processing forming gas anneal (FGA) on the electrical performance,…

physics.app-ph2026★ 1 cited

Shallow Trap States Control Electrical Performance of Amorphous Oxide Semiconductor Thin-Film Transistors

Måns J. Mattsson, Jinhan Lee, Christopher E. Malmberg +10

The performance of n-type amorphous oxide semiconductor thin-film transistors (TFTs) is largely controlled by the density of states (DoS) near the conduction band mobility edge. He…