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20052023
most citedSurface and interface study of pulsed-laser-deposited off-stoichiometric NiMnSb thin films on Si(100) substrate

19 citations · 29 across the 5 of their papers we have counts for

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cond-mat.mtrl-sci2018

Data reduction procedure for correction of geometrical factors in the analysis of specular x-ray reflectivity of small samples

Arijeet Das, Shreyashkar Dev Singh, R. J. Choudhari +2

For small samples, the modification of the XRR profile by the geometrical factors manifesting due to profile and size of the beam and the size of the sample is significant. Geometr…