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Data reduction procedure for correction of geometrical factors in the analysis of specular x-ray reflectivity of small samples
Arijeet Das, Shreyashkar Dev Singh, R. J. Choudhari +2
For small samples, the modification of the XRR profile by the geometrical factors manifesting due to profile and size of the beam and the size of the sample is significant. Geometr…
Lattice Misfit Measurement in Inconel 625 by X-Ray Diffraction Technique
P. Mukherjee, A. Sarkar, P. Barat +3
Determination of lattice misfit and microstructural parameters of the coherent precipitates in Ni based alloy Inconel-625 is a challenging problem as their peaks are completely ove…
Surface and interface study of pulsed-laser-deposited off-stoichiometric NiMnSb thin films on Si(100) substrate
S. Rai, M. K. Tiwari, G. S. Lodha +9
We report a detailed study of surface and interface properties of pulsed-laser deposited NiMnSb films on Si (100) substrate as a function of film thickness. As the thickness of fil…