71 citations · 317 across the 11 of their papers we have counts for
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Full field chemical imaging of buried native sub-oxide layers on doped silicon patterns
F. de la Peña, N. Barrett, L. F. Zagonel +2
Fully energy-filtered X-ray photoelectron emission microscopy is used to analyze the spatial distribution of the silicon sub-oxide structure at the SiO2/Si interface as a function…
Orientation-dependent surface composition of in situ annealed strontium titanate
Luiz F. Zagonel, Nicholas Barrett, Olivier Renault +5
The surface composition of polycrystalline niobium-doped strontium titanate (SrTiO3 : Nb) is studied using X-ray photoelectron emission microscopy (XPEEM) for many grain orientatio…
Thickness-dependent polarization of strained BiFeO3 films with constant tetragonality
J. E. Rault, W. Ren, S. Prosandeev +7
We measure the remnant polarization of ferroelectric domains in BiFeO3 films down to 3.6 nm using low energy electron and photoelectron emission microscopy. The measured polarizati…