most citedPotential Profiling of the Nanometer-Scale Charge Depletion Layer in n-ZnO/p-NiO Junction Using Photoemission Spectroscopy

31 citations · 31 across the 1 of their papers we have counts for

collaborators

2 papers

cond-mat.mtrl-sci2006★ 31 cited

Potential Profiling of the Nanometer-Scale Charge Depletion Layer in n-ZnO/p-NiO Junction Using Photoemission Spectroscopy

Y. Ishida, H. Ohta, M. Hirano +2

We have performed a depth-profile analysis of an all-oxide p-n junction diode n-ZnO/p-NiO using photoemission spectroscopy combined with Ar-ion sputtering. Systematic core-level sh…

cond-mat.str-el2005

Temperature Dependence of the Chemical Potential in NaxCoO2: Implications for the Large Thermoelectric Power

Y. Ishida, H. Ohta, A. Fujimori +1

We have performed a temperature-dependent photoemission study of a NaxCoO2 (x~0.8) epitaxial thin film prepared by the reactive solid-phase epitaxy method. The chemical potential s…