3 papers
cs.CV2026
AOI-SSL: Self-Supervised Framework for Efficient Segmentation of Wire-bonded Semiconductors In Optical Inspection
JoaquÃn Figueira, Rob Van Gastel, Giacomo D'Amicantonio +4
Segmentation models in automated optical inspection of wire-bonded semiconductors are typically device-specific and must be re-trained when new devices or distribution shifts appea…
cs.CV2026
Decorrelation Speeds Up Vision Transformers
Kieran Carrigg, Rob van Gastel, Melda Yeghaian +3
Masked Autoencoder (MAE) pre-training of vision transformers (ViTs) yields strong performance in low-label data regimes but comes with substantial computational costs, making it im…
cs.LG2025
Automated Discovery of Laser Dicing Processes with Bayesian Optimization for Semiconductor Manufacturing
David Leeftink, Roman Doll, Heleen Visserman +4
Laser dicing of semiconductor wafers is a critical step in microelectronic manufacturing, where multiple sequential laser passes precisely separate individual dies from the wafer.…