3 papers
cs.CV2026
A Generative Approach for Improving Multi-Label Defect Classification in Photovoltaic Modules
Abdul Mueez, Yogesh S. Rawat, Shruti Vyas
This paper addresses the challenge of multi-label defect classification in electroluminescence (EL) images of photovoltaic (PV) cells. Training models on images where multiple defe…
cs.CV2026
Bridging Foundation Models and ASTM Metallurgical Standards for Automated Grain Size Estimation from Microscopy Images
Abdul Mueez, Shruti Vyas
Extracting standardized metallurgical metrics from microscopy images remains challenging due to complex grain morphology and the data demands of supervised segmentation. To bridge…
cs.CV2025
SynSpill: Improved Industrial Spill Detection With Synthetic Data
Aaditya Baranwal, Abdul Mueez, Jason Voelker +2
Large-scale Vision-Language Models (VLMs) have transformed general-purpose visual recognition through strong zero-shot capabilities. However, their performance degrades significant…