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Jyoti Sharma, Rishikesh Pandey, Akhilesh Kumar Singh
We present here the comprehensive X-ray diffraction (XRD) and dielectric measurement of (1-x)Bi(Zn1/2Ti1/2)O3-xPbTiO3 (BZT-xPT) piezoceramics with x=0.65, 0.70, 0.75 and 0.80. Powd…