131 citations · 1.1k across the 48 of their papers we have counts for
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Thickness mapping and layer number identification of exfoliated van der Waals materials by Fourier imaging micro-ellipsometry
Ralfy Kenaz, Saptarshi Ghosh, Pradheesh Ramachandran +4
As properties of mono- to few layers of exfoliated van der Waals heterostructures are heavily dependent on their thicknesses, accurate thickness measurement becomes imperative in t…
Mapping single-shot angle-resolved spectroscopic micro-ellipsometry with sub-5 microns lateral resolution
Ralfy Kenaz, Ronen Rapaport
Spectroscopic ellipsometry is a widely used optical technique both in industry and research for determining the optical properties and thickness of thin films. The effective use of…
Collective interlayer pairing and pair superfluidity in vertically stacked layers of dipolar excitons
Michal Zimmerman, Ronen Rapaport, Snir Gazit
Layered bosonic dipolar fluids have been suggested to host a condensate of interlayer molecular bound states. However, its experimental observation has remained elusive. Motivated…