activity
20052019
most citedGrain-boundary grooving and agglomeration of alloy thin films with a slow-diffusing species

44 citations · 108 across the 7 of their papers we have counts for

collaborators

7 papers

cond-mat.mes-hall2019

Momentum Conserved Ultrafast Charge Transfer Dynamics of Interlayer Excitons in vdW Heterostructures

Pranjal Kumar Gogoi, Yung-Chang Lin, Ryosuke Senga +9

Heterostructures comprising van der Waals (vdW) stacked transition metal dichalcogenide (TMDC) monolayers are a fascinating class of two-dimensional (2D) materials with unique prop…

cond-mat.mes-hall2019★ 3 cited

Kondo Impurities in Two Dimensional MoS2 for Achieving Ultrahigh Thermoelectric Powerfactor

Jing Wu, Yanpeng Liu, Yi Liu +12

Local magnetic impurities arising from atomic vacancies in two-dimensional (2D) nanosheets are predicted to have a profound effect on charge transport due to resonant scattering, a…

physics.app-ph2018★ 10 cited

Liquid-solid surface phase transformation of fluorinated fullerene on monolayer tungsten diselenide

Zhibo Song, Qixing Wang, Ming-Yang Li +8

Hybrid van der Waals (vdW) heterostructures constructed by the integration of organic molecules and two-dimensional (2D) transition metal dichalcogenide (TMD) materials have useful…

cond-mat.mtrl-sci2006★ 44 cited

Grain-boundary grooving and agglomeration of alloy thin films with a slow-diffusing species

Mathieu Bouville, Dongzhi Chi, David J. Srolovitz

We present a general phase-field model for grain-boundary grooving and agglomeration of polycrystalline alloy thin films. In particular, we study the effects of slow-diffusing spec…

cond-mat.mtrl-sci2006★ 10 cited

Interplay between grain boundary grooving, stress, and dealloying in the agglomeration of NiSi1-xGex films

H. B. Yao, M. Bouville, D. Z. Chi +4

Germanosilicides, especially those formed on compressive substrates, are less stable than silicides against agglomeration. By studying the solid-state reaction of Ni thin film on s…

cond-mat.mtrl-sci2005★ 19 cited

Pyramidal structural defects in erbium silicide thin films

Eu Jin Tan, Mathieu Bouville, Dong Zhi Chi +5

A new pyramidal structural defect, 5 to 8 micron wide, has been discovered in thin films of epitaxial erbium disilicide formed by annealing thin Er films on Si(001) substrates at t…