2 papers
cs.AR2026
ITHICA: Intra-Thread Instruction Checking Approach for Defect-Induced Silent Data Corruptions
Ioanna Vavelidou, Subho S. Banerjee, Eric X. Liu +3
Hyperscaler reports of silent data corruptions (SDCs), presumed to be caused by silicon manufacturing defects, have motivated the development of functional tests for detecting defe…
cs.LG2026
Report for NSF Workshop on AI for Electronic Design Automation
Deming Chen, Vijay Ganesh, Weikai Li +7
This report distills the discussions and recommendations from the NSF Workshop on AI for Electronic Design Automation (EDA), held on December 10, 2024 in Vancouver alongside NeurIP…