collaborators

1 paper

cs.AR2026

ITHICA: Intra-Thread Instruction Checking Approach for Defect-Induced Silent Data Corruptions

Ioanna Vavelidou, Subho S. Banerjee, Eric X. Liu +3

Hyperscaler reports of silent data corruptions (SDCs), presumed to be caused by silicon manufacturing defects, have motivated the development of functional tests for detecting defe…