2 papers
cs.AR2026
ITHICA: Intra-Thread Instruction Checking Approach for Defect-Induced Silent Data Corruptions
Ioanna Vavelidou, Subho S. Banerjee, Eric X. Liu +3
Hyperscaler reports of silent data corruptions (SDCs), presumed to be caused by silicon manufacturing defects, have motivated the development of functional tests for detecting defe…
cs.AR2025
Silent Data Corruption by 10x Test Escapes Threatens Reliable Computing
Subhasish Mitra, Subho Banerjee, Martin Dixon +5
Too many defective compute chips are escaping existing manufacturing tests -- at least an order of magnitude more than industrial targets across all compute chip types in data cent…