625 citations · 3.8k across the 77 of their papers we have counts for
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cond-mat.mtrl-sci2005★ 19 cited
Pyramidal structural defects in erbium silicide thin films
Eu Jin Tan, Mathieu Bouville, Dong Zhi Chi +5
A new pyramidal structural defect, 5 to 8 micron wide, has been discovered in thin films of epitaxial erbium disilicide formed by annealing thin Er films on Si(001) substrates at t…
cond-mat.mtrl-sci2005★ 22 cited
Phase-field model for grain boundary grooving in multi-component thin films
Mathieu Bouville, Shenyang Hu, Long-Qing Chen +2
Polycrystalline thin films can be unstable with respect to island formation (agglomeration) through grooving where grain boundaries intersect the free surface and/or thin film-subs…