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1 paper

physics.ins-det2026

Direct On-Wafer Measurements of Noise Parameters in C- and X-bands at K

Daniil Frolov, Jean-Olivier Plouchart, Utku Soylu

This paper describes the setup and the results of the direct on-wafer measurements of a FET noise parameters obtained with a source-pull method at temperatures down to T=4K and in…