29 citations · 51 across the 2 of their papers we have counts for
1 paper · 1 filter
D. H. Lumb, F. E. Christensen, C. P. Jensen +1
We describe measurements of the X-ray reflectance in the range 2 to 10 keV of samples representative of coated silicon wafers that are proposed for the fabrication of the XEUS (X-r…